1. Hondak M. A new threat-EMI effect by indirect ESD on electronic equipment. IEEE Transactions on Industry, 1989, 25(1): 939-944
2. Daout B, Ryser H. The correlation of rising slope and speed of approach in ESD. Proceedings of The 7th International Symposium on Electromagnetic Compatibility, Feb 27-Mar 3, 1987, Zurich, Switzerland. 1987: 467-474
3. Pommenrenke D. ESD: transient fields, arc simulation and time limit. Journal of Electrostatics, 1995, 36(1): 31-54
4. Mori I, Taka Y, Fujiwara O. A circuit approach to calculate discharge current through hand-held metal piece from charged human-body. Proceedings of the 2nd International Conference on Electromagnetic Compatibility, Jul 27-29, 2005, Pucket, Thailand. 2005: 4A-4
5. Fujiwara O. An analytical approach to model indirect effect caused by electrostatic discharge. IEICE Transactions on Communication, 1996, E79-B(4): 483-489
6. Bonisch S, Kalkner W, Pommerenke D. Modeling of short-gap ESD under consideration of different discharge mechanisms. IEEE Transactions on Plasma Science, 2003, 31(4): 736-744
7. Bonish S, Pommerenke D, Kalker W. Broadband measurement of ESD risetime to distinguish between different discharge mechanisms. Proceedings of the 23rd EOS/ESD Symposium, Oct 8-12, 2001, Portland/Oregon, OR, USA. 2001: 373-384
8. Mesyats G A, Prokurovsky D I. Current growth in pulse breakdown of a short vacuum gap. Soviet Physics Journal, 1968, 11(1): 49-51 |