1. Kraft C H. Modeling leakage through finite apertures with TLM. Proceedings of IEEE International Symposium on Electromagnetic Compatibility. Aug 22-26, 1994, Chicago, IL, USA. Piscataway, NJ, USA: IEEE, 1994: 73-76
2. Kunz K S, Luebbers R J. The Finite difference time domain method for electromagnetics. Orlando, FL, USA: CRC Press, 1993
3. Liu S K, Fu J M, Cheng Y S, et al. Numerical studies on resonant effects of FREMP into a cavity through a slot. High Power and Particle Beams, 1999, 11(4): 495-498 (in Chinese)
4. Graziano C, Roberto D L, Mariani P V. Theoretical and experimental evaluation of the electromagnetic radiation from apertures in shielded enclosure. IEEE Transactions on Electromagnetic Compatiblity, 1992, 34(4): 423-432
5. Robinson M P, Benson T M, Christopoulos C D, et al. Analytical formulation for theshielding effectiveness of enclosures with apertures. IEEE Transactions on Electromagnetic Compatibility, 1998, 40(8): 240-248
6. Gupta K C, Grag R, Bahl I J. Microstrip lines and slot lines. Norwood, MA, USA: Artech House Press, 1979
7. Turner J D, Benson T M, Christopoulos C, et al. Characterization of the shielding effectiveness of equipment cabinets aiming apertures, Proceedings of IEEE International Symposium on Electromagnetic Compatibility, Sep 17-20, 1996, Rome, Italy. Piscataway, NJ, USA: IEEE, 1996: 574-578
8. Antonio J, Lozano G, Alejandro D M, et Al. Resonance suppression in enclosures with a metallic-lossy dielectric layer by means of genetic algorithms. Proceedings of IEEE International Symposium on Electromagnetic Compatibility. Honolulu, HI. USA. Piscataway, NJ, USA: IEEE, 2007: 5p
9. Öktem M H, Saka B. Design of multilayered cylindrical shields using a genetic algorithm. IEEE Transactions on Electromagnetic Compatibility, 2001, 43(2): 170-176
10. Yamane T, Nishikata A, Shimizu Y. Resonance suppression of a spherical electromagnetic shielding enclosure by using conductive dielectrics. IEEE Transactions on Electromagnetic Compatibility, 2000, 42(4): 441-448
11. Zhu C Q, Liu S H, Wei M. A study on test & measurement of the radiated field by ESD. Chinese Journal of Electronics, 2005, 33(9): 1702-1705 (in Chinese) |