中国邮电高校学报(英文) ›› 2024, Vol. 31 ›› Issue (2): 3-9.doi: 10.19682/j.cnki.1005-8885.2024.0001

所属专题: 集成电路

• Semiconductor Devices •    下一篇

Superjunction 4H-SiC trench-gate IGBT with an integrated clamping PN diode

黄义1,王学成1,高升2,刘斌1,张红升1,韩根全3   

  1. 1. 重庆邮电大学光电工程学院
    2. 重庆邮电大学
    3. 西安电子科技大学
  • 收稿日期:2023-10-19 修回日期:2024-02-25 出版日期:2024-04-30 发布日期:2024-04-30
  • 通讯作者: 高升 E-mail:gaosheng@cqupt.edu.cn
  • 基金资助:
    重庆市自然科学基金;重庆市技术创新与应用示范重点项目基金;重庆邮电大学博士科研启动基金

Superjunction 4H-SiC trench-gate IGBT with an integrated clamping PN diode

  • Received:2023-10-19 Revised:2024-02-25 Online:2024-04-30 Published:2024-04-30
  • Contact: Sheng Gao E-mail:gaosheng@cqupt.edu.cn
  • Supported by:

    This work was supported by the General Program of National Natural Science Foundation of Chongqing (CSTB2023NSCQ-MSX0475), the Doctoral Research Start-up Fund of Chongqing University of Posts and Telecommunications (A2023-7), and the Technology Innovation and Application Demonstration key Project of Chongqing Municipality (cstc2019jszx-zdztzxX0005, cstc2020jscx-gksbX0011).

摘要:

In this paper, a novel superjunction 4H-silicon carbide (4H-SiC) trench-gate insulated-gate bipolar transistor (IGBT) featuring an integrated clamping PN diode between the P-shield and emitter (TSD-IGBT) is designed and theoretically studied. The heavily doping superjunction layer contributes to a low specific on-resistance, excellent electric field distribution, and quasi-unipolar drift current. The anode of the clamping diode is in floating contact with the P-shield. In the on-state, the potential of the P-shield is raised to the turn-on voltage of the clamping diode, which prevents the hole extraction below the N-type carrier storage layer (NCSL). Additionally, during the turn-off transient, once the clamping diode is turned on, it also promotes an additional hole extraction path. Furthermore, the potential dropped at the semiconductor near the trench-gate oxide is effectively reduced in the off-state.

关键词: 4H-SiC,沟槽栅,超结,钳位二极管

Abstract:

In this paper, a novel superjunction 4H-silicon carbide (4H-SiC) trench-gate insulated-gate bipolar transistor (IGBT) featuring an integrated clamping PN diode between the P-shield and emitter (TSD-IGBT) is designed and theoretically studied. The heavily doping superjunction layer contributes to a low specific on-resistance, excellent electric field distribution, and quasi-unipolar drift current. The anode of the clamping diode is in floating contact with the P-shield. In the on-state, the potential of the P-shield is raised to the turn-on voltage of the clamping diode, which prevents the hole extraction below the N-type carrier storage layer (NCSL). Additionally, during the turn-off transient, once the clamping diode is turned on, it also promotes an additional hole extraction path. Furthermore, the potential dropped at the semiconductor near the trench-gate oxide is effectively reduced in the off-state.

Key words:

4H-silicon carbide(4H-SiC), trench-gate, superjunction, clamping diode