Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination

doi:10.1016/S1005-8885(16)60059-6

中国邮电高校学报(英文) ›› 2016, Vol. 23 ›› Issue (5): 61-67.doi: 10.1016/S1005-8885(16)60059-6

Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination

李庆娅1,3,高锦春1,3,谢刚2,3,金秋延1,3,纪锐1,3

北京邮电大学

收稿日期:2016-05-12 修回日期:2016-09-26 出版日期:2016-10-30 发布日期:2016-10-26
通讯作者: 李庆娅 E-mail:liqingya@bupt.edu.cn
基金资助:
the National Natural Science Foundation of China

Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination

Li Qingya1, 3, Gao Jinchun1, 3 , Xie Gang2, 3, Jin Qiuyan1, 3, Ji Rui1, 3

Received:2016-05-12 Revised:2016-09-26 Online:2016-10-30 Published:2016-10-26
Contact: Qing-Ya LI E-mail:liqingya@bupt.edu.cn
Supported by:
the National Natural Science Foundation of China

摘要/Abstract

摘要： Electrical connectors play a significant role in the electronic and communication systems. As they are often exposed in the atmosphere environment, it is extremely easy for them to cause electrical contact failure. It is essential to carry out the reliability modeling and predict the lifetime. In the present work, the accelerated lifetime testing method which is on account of the uniform design method was designed to obtain the degradation data under multiple environmental stresses of temperature and particulate contamination for electrical connectors. Based on the degradation data, the pseudo life can be acquired. Then the reliability model was established by analyzing the pseudo life. Accordingly, the reliability function and reliable lifetime function were set up, and the reliable lifetime of the connectors under the multiple environment stresses of temperature and particulate contamination could be predicted for electrical connectors.

关键词: electrical connectors, accelerated lifetime testing, lifetime prediction

Abstract: Electrical connectors play a significant role in the electronic and communication systems. As they are often exposed in the atmosphere environment, it is extremely easy for them to cause electrical contact failure. It is essential to carry out the reliability modeling and predict the lifetime. In the present work, the accelerated lifetime testing method which is on account of the uniform design method was designed to obtain the degradation data under multiple environmental stresses of temperature and particulate contamination for electrical connectors. Based on the degradation data, the pseudo life can be acquired. Then the reliability model was established by analyzing the pseudo life. Accordingly, the reliability function and reliable lifetime function were set up, and the reliable lifetime of the connectors under the multiple environment stresses of temperature and particulate contamination could be predicted for electrical connectors.

Key words: electrical connectors, accelerated lifetime testing, lifetime prediction

中图分类号:

TM501+.3

Li Qingya, Gao Jinchun, Xie Gang, Jin Qiuyan, Ji Rui. Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination[J]. JOURNAL OF CHINA UNIVERSITIES OF POSTS AND TELECOM, 2016, 23(5): 61-67.

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Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination

Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination

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