The Journal of China Universities of Posts and Telecommunications
Analysis of 3D NAND technologies and comparison between charge-trap-based and floating-gate-based flash devices
刘世军 邹雪城
JOURNAL OF CHINA UNIVERSITIES OF POSTS AND TELECOM . 2017, (3): 75 -82 .  DOI: 10.1016/S1005-8885(17)60214-0

Copyright © 2020 The Journal of China Universities of Posts and Telecommunications
　 Adress: P.O. Box 231,Beijing University of Posts and Telecommunications,10 Xi Tucheng Road,Beijing 100876,P.R.China　Post Code: 100081
Tel：86-010-62282493　Fax： 86-010-62283461　E-mail: jchupt@bupt.edu.cn
Support by: Beijing Magtech Co.Ltd