<p class="MsoNormal" align="center" style="text-align:left;"> Predicting stability of integrated circuit test equipment using upper side boundary values of normal distribution

詹文法胡心怡郑江云余储贤蔡雪原张礼华

Predicting stability of integrated circuit test equipment using upper side boundary values of normal distribution

中国邮电高校学报(英文) . 2024, (2): 85 -93 . DOI: 10.19682/j.cnki.1005-8885.2024.0002