The Journal of China Universities of Posts and Telecommunications
Predicting stability of integrated circuit test equipment using  upper side boundary values of normal distribution
詹文法 胡心怡 郑江云 余储贤 蔡雪原 张礼华
The Journal of China Universities of Posts and Telecommunications . 2024, (2): 85 -93 .  DOI: 10.19682/j.cnki.1005-8885.2024.0002

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